| National Academy of Sciences of Ukraine Scientific Center "Institute
  for Nuclear Research"
 Department
  of Plasma Physics, Kiev, Ukraine
 
  
  | Prof.
  G.S. Kirichenko Prof. V.A. Saenko
 Dr. A.G. Borisenko
 | Know  How! | The
  new type of the plasma source and the thin film deposition technology
  on the basis of the Arc Discharge in the Vapors of the Anode Materials
  (ADVAM) |  
   
  Thin
  Films Deposition Technology The new type of the plasma source and the thin film deposition technology
  on the basis of the arc discharge in the vapors of the anode materials (ADVAM)
  were constructed. The previous studies as well as the tests of plasma source
  models have shown, that:
 
   It is possible to produce the films with
  a large adhesion on substrates from different kinds of materials without
  the use of additional sub-layers ensuring the needed adhesion level,
  in particular the films of copper on Si, SiO2, and others.
   Ion part in a plasma flow of a source
  can be regulated from 10 % up to 80 % depending on the chosen mode of
  work, working material and constructional features of a used plasma
  source. In particular, for a copper plasma flow the part of ions in
  a flow equals up to 35 %, and for Ti it reaches 85 %. This allows to
  create technological modes with the self-sputtering of deposited films
  by ions of the plasma flow itself.  It was found with the help of a reverse
  Rutherford scattering technique that the amount of impurities in deposited
  copper films at different operating plasma source modes does not exceed
  0.05 %. Use of high-quality copper mirrors with reflection factor of
  99.2 % which were manufactured with the help of our methods, confirms
  these data.  Our studies have shown that by a choice
  of the appropriate mode of a plasma source operation, it is possible
  to regulate as a value of an insulated dielectric substrate floating
  potential, as the energy reaching the ion substrate, and by this way
  to avoid or considerably reduce the quantity of defects in deposited
  films or in superficial layers of a substrate.  Practical
  applications. With the help of this source
 
  high-quality copper laser mirrors with
  reflection factor of 99.2 % (
   l =1.315
  microns), contrast x-ray photo masks, high-quality functional, conducting, contact
  and barrier layers in microelectronics, conducting layers and executive elements
  in micromechanics, a series of protective and decorative
  coverings, including coverings of multicomponent structure were created
  and used.   Possible
  practical use of the offered development. Offered for development plasma sources can be applied for:
 
   Technological operations in manufacturing
  the microcircuits of sub-micron technologies in which absence of a drop
  phase in the flow, fraction of ions in it, presence of a compensated
  flow volumetric charge are extremely important. The source can effectively
  be used in the new "know-how" of microcircuits with different purposes,
  and with the use of copper instead of aluminium.  Deposition of high-adhesive films of
  a wide series of materials (Cu, Ni, Cr, Ti, Ta, Nb, Mo, W, U,  Au,
  Ag and others) and coverings of different purposes on dielectric, semi-conductor
  and metal substrates (including copper films ) without additional sub-layers.
  Deposition of high-adhesive sub-layers. Deposition of superthin films. Deposition of films and coatings which
  can simultaneously and purposefully influence on their properties due
  to the controlled change of ion component parameters in a deposited
  plasma flow without introducing additional harmful impurities in the
  film structure.  Realizations of technological modes with
  regulated self-sputtering of deposited by ions films in the used plasma
  flow. Such modes can represent a basis of new technological processes
  of conducting copper layers formation in manufacturing the microcircuits
  of sub-micron technology.  Deposition of films and coatings based
  on intercompounds of metals with gases: nitrides, oxides, borides and
  others.   This
  plasma source was successfully used for the high-adhesive films production
  for various aims: high-quality copper laser mirrors; contrast x-ray masks;
  high-quality functional, conducting, contact and barrier layers for microelectronics;
  conducting layers and executive elements in micromechanics; a number of
  protective and decorative coverings, including multicomponent coverings.
 APPLICATIONS SPECIFICATIONSTechnological processes of microelectronics, micromechanics, precision
  instrument manufacture, deposition of protective, hardening, corrosion-resisting
  and decorative coatings.
 This plasma source can generate macroparticle-free plasma flows of various
  substances with controllable ion energies, starting Ei ( 50 eV, to form
  functional layers with minimum structural defects and high adhesibility.
  High fraction of ions in flow allows one to directly process the growing
  covering by ions of deposited material without use of ions of other chemical
  elements, thus increasing purity and quality of films.
 The sources are estimated to be applicable for manufacturing of copper
  films, instead of aluminum films, in microelectronics. Operation modes
  with controlled self-sputtering of deposited films by ions may be especially
  useful for producing of conducting copper layers in manufacturing of microcircuits
  with sub-micron patterns.
 It can be used for vacuum deposition of high-adhesive thin films of metals
  with different melting temperatures and chemical activities in melted
  state. Also, for deposition of thin films of complex composition (oxides,
  nitrides, and carbides), during the pure-gas discharge the source is used
  to carryout the final ion refinement of substrates justs before the thin
  film deposition.
 The source is compatible with any standard equipment, it is intended for
  thin film deposition.
 
 
  
  | Total consumed power,
  kW | .3 to 5 |  |  |  
  |  Arc current range,
  A | .2 to 10 |  |  |  
  | Range of voltage drop
  at the arc, kV | 0.2 to 0.8 | Density of ion current
  on the substrate, mA/cm2 | to
  2. |  
  | Range of voltages at
  the additional anode,kV | 0.1 to 0.5 | Diameter of plating
  area, mm | 150 |  
  | Magnetic field intensity,
  kA/m | 8 to 12 | Film in thickness inhomogeneity
  in plating area, % | ±10 |  
  | Rate of evaporation
  of working substance,mg/s | 0.3 to 0.5 | Working substance  | Ti, Ni, Cu, Cr, Al, Ta, Nb, C,
  Mo, W |  
  | Degree of substance
  ionization in the flow, % | to 85 |  |  
  |  Rate of the thin film
  deposition at stationary exposition of substrates, nm/s | 0.1 to 2 | Dimensions, mm: diameter x height
 | 170 x 200. |  |